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Shear strength and fracture mechanism for full Cu-Sn IMCs solder joints with different Cu3Sn proportion and joints with conventional interfacial structure in electronic packaging

Peng Yao (College of Materials Science and Engineering, Beijing University of Technology, Beijing, China)
Xiaoyan Li (College of Materials Science and Engineering, Beijing University of Technology, Beijing, China)
Xu Han (College of Materials Science and Engineering, Beijing University of Technology, Beijing, China)
Liufeng Xu (College of Materials Science and Engineering, Beijing University of Technology, Beijing, China)

Soldering & Surface Mount Technology

ISSN: 0954-0911

Article publication date: 18 February 2019

603

Abstract

Purpose

This study aims to analyze the shear strength and fracture mechanism of full Cu-Sn IMCs joints with different Cu3Sn proportion and joints with the conventional interfacial structure in electronic packaging.

Design/methodology/approach

The Cu-Sn IMCs joints with different Cu3Sn proportion were fabricated through soldering Cu-6 μm Sn-Cu sandwich structure under the extended soldering time and suitable pressure. The joints of conventional interfacial structure were fabricated through soldering Cu-100 μm Sn-Cu sandwich structure. After the shear test was conducted, the fracture mechanism of different joints was studied through observing the cross-sectional fracture morphology and top-view fracture morphology of sheared joints.

Findings

The strength of joints with the conventional interfacial structure was 26.6 MPa, while the strength of full Cu-Sn IMCs joints with 46.7, 60.6, 76.7 and 100 per cent Cu3Sn was, respectively, 33.5, 39.7, 45.7 and 57.9 MPa. The detailed reason for the strength of joints showing such regularity was proposed. For the joint of conventional interfacial structure, the microvoids accumulation fracture happened within the Sn solder. However, for the full Cu-Sn IMCs joint with 46.7 per cent Cu3Sn, the cleavage fracture happened within the Cu6Sn5. As the Cu3Sn proportion increased to 60.6 per cent, the inter-granular fracture, which resulted in the interfacial delamination of Cu3Sn and Cu6Sn5, occurred along the Cu3Sn/Cu6Sn5 interface, while the cleavage fracture happened within the Cu6Sn5. Then, with the Cu3Sn proportion increasing to 76.7 per cent, the cleavage fracture happened within the Cu6Sn5, while the transgranular fracture happened within the Cu3Sn. The inter-granular fracture, which led to the interfacial delamination of Cu3Sn and Cu, happened along the Cu/Cu3Sn interface. For the full Cu3Sn joint, the cleavage fracture happened within the Cu3Sn.

Originality/value

The shear strength and fracture mechanism of full Cu-Sn IMCs joints was systematically studied. A direct comparison regarding the shear strength and fracture mechanism between the full Cu-Sn IMCs joints and joints with the conventional interfacial structure was conducted.

Keywords

Acknowledgements

This investigation was supported by National Natural Science Foundation of China under the grant of No. 51575011 and Beijing Natural Science Foundation under the grant of No. 2162002.

Citation

Yao, P., Li, X., Han, X. and Xu, L. (2019), "Shear strength and fracture mechanism for full Cu-Sn IMCs solder joints with different Cu3Sn proportion and joints with conventional interfacial structure in electronic packaging", Soldering & Surface Mount Technology, Vol. 31 No. 1, pp. 6-19. https://doi.org/10.1108/SSMT-06-2018-0018

Publisher

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Emerald Publishing Limited

Copyright © 2018, Emerald Publishing Limited

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