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Article Information:

Title:

Using data envelopment analysis (DEA) to evaluate the operational performance of the wafer fabrication industry in Taiwan

Author(s):

Yu-Shan Chen, Bi-Yu Chen

Journal:

Journal of Manufacturing Technology Management

ISSN:

1741-038X

Year:

2009

Volume:

20

Issue:

4

Page:

475 - 488

DOI:

10.1108/17410380910953739

Publisher:

Emerald Group Publishing Limited

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