Emerald Login
   

Welcome guest



Microelectronics International
Browse
User Guides
Online Access
Journal Information

Microelectronics International


Volume 22 Issue 3

Published: 2005 | Start Page: 3

Icon Key:   Icon: Requires login or subscription. Requires login or subscription   Icon: Backfiles. Backfiles   Icon: EarlyCite. EarlyCite

Articles

Articles
Article No: Article Information:
1513133 Thermal management of multi-chip module and printed circuit board using FEM and genetic algorithms
K. Jeevan, G.A. Quadir, K.N. Seetharamu, I.A. Azid (pp. 3-15)
Keywords: Finite element analysis, Printed-circuit boards, Programming and algorithm theory
ArticleType: Technical paper
Icon: Requires login or subscription. View HTML | View PDF (876 KB) | Reprints & Permissions
1513134 Flexible electronics: silicon meets paper and beyond
J. Whitmarsh (pp. 16-19)
Keywords: Electronics industry, Emergent strategy, Flexible manufacturing systems, Printed circuits
ArticleType: General review
Icon: Requires login or subscription. View HTML | View PDF (386 KB) | Reprints & Permissions
1513135 Performance exploration of adder architectures for small to moderate-sized low-power, high-performance adders
Anu Gupta, Chandra Shekhar (pp. 20-27)
Keywords: design and theory, Modelling, Printed circuits, Structural analysis
ArticleType: Research paper
Icon: Requires login or subscription. View HTML | View PDF (181 KB) | Reprints & Permissions
1513136 Delay analysis of a single voltage-scaled-repeater driven long interconnect
Rajeevan Chandel, S. Sarkar, R.P. Agarwal (pp. 28-33)
Keywords: Electric power systems, Printed circuits, Voltage
ArticleType: Research paper
Icon: Requires login or subscription. View HTML | View PDF (223 KB) | Reprints & Permissions
1513137 Effects of MOSFET mismatch on the performance of single supply low voltage operational amplifiers
Radhalakshmi Ramakrishnan, Maqsood A. Chaudhry (pp. 34-38)
Keywords: Amplifiers, Design, Printed circuits, Voltage
ArticleType: Research paper
Icon: Requires login or subscription. View HTML | View PDF (192 KB) | Reprints & Permissions
1513138 Transition time considerations in repeater-chains
Rajeevan Chandel, S. Sarkar, R.P. Agarwal (pp. 39-40)
Keywords: Printed circuits, Signal generators, Simulation
ArticleType: Research paper
Icon: Requires login or subscription. View HTML | View PDF (99 KB) | Reprints & Permissions

Association news

New Chairman for IMAPS UK
Item No: Item Information
1513139 New Chairman for IMAPS UK
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML

Industry news

Aeroflex Incorporated announces agreement in principle for acquisition of UbiNetics Test & Measurement Division
Item No: Item Information
1513140 Aeroflex Incorporated announces agreement in principle for acquisition of UbiNetics Test & Measurement Division
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Sharp showcases Newest Advancements in Liquid Crystal Display Technology at Society for Information Display International Symposium
Item No: Item Information
1513141 Sharp showcases Newest Advancements in Liquid Crystal Display Technology at Society for Information Display International Symposium
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Design Automation Conference Professional Development Fund to award more than $165,000
Item No: Item Information
1513142 Design Automation Conference Professional Development Fund to award more than $165,000
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Bookham unveils expanded display technology portfolio at SID 2005
Item No: Item Information
1513143 Bookham unveils expanded display technology portfolio at SID 2005
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Thermo Electron wins Omega NorthFace ScoreBoard Award for excellence in customer service
Item No: Item Information
1513144 Thermo Electron wins Omega NorthFace ScoreBoard Award for excellence in customer service
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
ECS researchers to present at world's biggest nano technology show
Item No: Item Information
1513145 ECS researchers to present at world's biggest nano technology show
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
FSA and IEE keynotes for IEE/FSA International Semi conductor Executive Forum
Item No: Item Information
1513146 FSA and IEE keynotes for IEE/FSA International Semi conductor Executive Forum
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Phoenix X-Ray Systems and Services honoured with Frost & Sullivan's 2004 Product Line Strategy Leadership Award
Item No: Item Information
1513147 Phoenix X-Ray Systems and Services honoured with Frost & Sullivan's 2004 Product Line Strategy Leadership Award
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Memec Insight launches 2005 Analog Challenge
Item No: Item Information
1513148 Memec Insight launches 2005 Analog Challenge
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Cable First automates processing of smallest cables
Item No: Item Information
1513149 Cable First automates processing of smallest cables
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
IEF2005 – 1-3 May 2005 – Portomaso, Malta
Item No: Item Information
1513150 IEF2005 – 1-3 May 2005 – Portomaso, Malta
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
ECOC event on target to top 300 exhibitors as interest grows
Item No: Item Information
1513151 ECOC event on target to top 300 exhibitors as interest grows
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML

Appointments

Enthone appoints Kristian Story Key Account Manager – Microelectronics
Item No: Item Information
1513152 Enthone appoints Kristian Story Key Account Manager – Microelectronics
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML

Exhibitions and conferences

A review of NEPCON 2005
Item No: Item Information
1513153 A review of NEPCON 2005
Journal: Microelectronics International
Vol : 22 Issue: 3
Author(s): John Ling
Icon: Requires login or subscription View HTML

International diary

International diary
Item No: Item Information
1513154 International diary
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML

New products

Thermo Electron's ARL QUANT'X EDXRF Spectrometer complies with New RoHS and WEEE Regulations
Item No: Item Information
1513155 Thermo Electron's ARL QUANT'X EDXRF Spectrometer complies with New RoHS and WEEE Regulations
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Revolutionary K-Route™ placement-independent interconnect synthesis melds routing and optimisation for predictable convergence and best quality of results
Item No: Item Information
1513156 Revolutionary K-Route™ placement-independent interconnect synthesis melds routing and optimisation for predictable convergence and best quality of results
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Varistors: CeraDiodes in new sizes
Item No: Item Information
1513157 Varistors: CeraDiodes in new sizes
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Agilent Technologies' 4 Gb/s Fibre Channel controller sets performance record for storage networking applications
Item No: Item Information
1513158 Agilent Technologies' 4 Gb/s Fibre Channel controller sets performance record for storage networking applications
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Low pressure moulding solution streamlines manufacture and extends scope for automotive sensors
Item No: Item Information
1513159 Low pressure moulding solution streamlines manufacture and extends scope for automotive sensors
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Polatis expands range of Ultra low loss Optical Switch Products
Item No: Item Information
1513160 Polatis expands range of Ultra low loss Optical Switch Products
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Bookham launches world's first 24pin transmitter module using InP MZ technology
Item No: Item Information
1513161 Bookham launches world's first 24pin transmitter module using InP MZ technology
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
INtrobotics announces production bandwidth measurement capability on CI1000 automated TDR system
Item No: Item Information
1513162 INtrobotics announces production bandwidth measurement capability on CI1000 automated TDR system
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Thermo offers unprecedented thin film analysis with new X-ray detector options for Microbeam XRF metrology systems
Item No: Item Information
1513163 Thermo offers unprecedented thin film analysis with new X-ray detector options for Microbeam XRF metrology systems
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML
Thermo Electron Introduces Theta 300XT, 300 mm thickness and composition metrology for ultra-thin films and shallow implant
Item No: Item Information
1513164 Thermo Electron Introduces Theta 300XT, 300 mm thickness and composition metrology for ultra-thin films and shallow implant
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML

Interview

Spotlight on Dan Steinbock
Item No: Item Information
1513165 Spotlight on Dan Steinbock
Journal: Microelectronics International
Vol : 22 Issue: 3
Icon: Requires login or subscription View HTML

Internet commentary

Internet commentary
Item No: Item Information
1513166 Internet commentary
Journal: Microelectronics International
Vol : 22 Issue: 3
Author(s): Brian Ellis
Icon: Requires login or subscription View HTML