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Microelectronics International

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Articles

Articles

Article No:	Article Information:
1593467	Design of an asynchronous least common multiple circuit V. Bansal, A. Nandy, K.T. Lau (pp. 4-7) Keywords: Circuit properties, Circuits ArticleType: Research paper View HTML | View PDF (114 KB) | Reprints & Permissions
1593468	Studies on electrical properties of polymer thick film resistors Y. Srinivasa Rao (pp. 8-14) Keywords: Electrical resistivity, Films (states of matter), Temperature ArticleType: Research paper View HTML | View PDF (317 KB) | Reprints & Permissions
1593469	Modifying electric artworks to improve dimensional stability of microelectronic substrates Parsaoran Hutapea, Joachim L. Grenestedt (pp. 15-22) Keywords: Deformation, Finite element analysis, Substrates ArticleType: Research paper View HTML | View PDF (429 KB) | Reprints & Permissions
1593470	Effects of die-pad resonance on ultrasonic bond quality of wire bonds Narasimalu Srikanth (pp. 23-26) Keywords: Bonding, Deformation, Plastic analysis ArticleType: Research paper View HTML | View PDF (285 KB) | Reprints & Permissions
1593471	Modeling and simulation of NTC thick film thermistor geometries O.S. Aleksic, B.M. Radojcic, R.M. Ramovic (pp. 27-34) Keywords: Electrical resistivity, Films (states of matter) ArticleType: Research paper View HTML | View PDF (350 KB) | Reprints & Permissions
1593472	?/2 Microstrip rejection filter behavior due to ferrite thin film overlay in the absence of external magnetic field Vandan Surve, Vijaya Puri (pp. 35-39) Keywords: Electronic equipment and components, Microwave circuits, Thin films ArticleType: Research paper View HTML | View PDF (240 KB) | Reprints & Permissions
1593473	Voltage scaling – a novel approach for crosstalk reduction in global VLSI interconnects B.K. Kaushik, S. Sarkar, R.P. Agarwal, R.C. Joshi (pp. 40-45) Keywords: Electronic equipment and components, Simulation, Voltage fluctuations ArticleType: Research paper View HTML | View PDF (461 KB) | Reprints & Permissions
1593474	Study of the effect of substrate bias on the electrical properties of sputtered HfO2 thin film deposited on silicon substrate R.K. Nahar, Aparna Sharma (pp. 46-48) Keywords: Electrical conductivity, Substrates, Thin films ArticleType: Research paper View HTML | View PDF (160 KB) | Reprints & Permissions
1593475	Investigations of mechanical strength and electrical resistance of adhesives and adhesive joints in liquid nitrogen B. Bober, A. Bochenek, B. Olszewska-Mateja, Z. Zaluk (pp. 49-53) Keywords: Adhesives, Electrical resistivity, Shear strength ArticleType: Research paper View HTML | View PDF (217 KB) | Reprints & Permissions

Editorial

Sixty years of electronics

Item No:	Item Information
1593476	Sixty years of electronics Journal: Microelectronics International Vol : 24 Issue: 1 Author(s): Brian Ellis View HTML

Note from the publisher

Emerald at 40

Item No:	Item Information
1593477	Emerald at 40 Journal: Microelectronics International Vol : 24 Issue: 1 Author(s): Rebecca Marsh View HTML

Industry news

iSLI hosts event to welcome new students

Item No:	Item Information
1593478	iSLI hosts event to welcome new students Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

MCE offers finer geometry ASICs for hand held devices

Item No:	Item Information
1593479	MCE offers finer geometry ASICs for hand held devices Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

Laird Technologies establishes presence in India

Item No:	Item Information
1593480	Laird Technologies establishes presence in India Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

iSLI makes industry-standard, electronic design software available to startups in Scotland

Item No:	Item Information
1593481	iSLI makes industry-standard, electronic design software available to startups in Scotland Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

New home for Innos at Southampton technology site

Item No:	Item Information
1593482	New home for Innos at Southampton technology site Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

"More Moore" shows European EUV innovation at EUV 2006 in Barcelona

Item No:	Item Information
1593483	"More Moore" shows European EUV innovation at EUV 2006 in Barcelona Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

Appointments

Pickering Interfaces hires new UK and Ireland Sales Manager

Item No:	Item Information
1593484	Pickering Interfaces hires new UK and Ireland Sales Manager Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

Dialight Lumidrives appoints new sales manager

Item No:	Item Information
1593485	Dialight Lumidrives appoints new sales manager Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

New products

Hamlin launches versatile hall effect geartooth sensor for automotive grade applications

Item No:	Item Information
1593486	Hamlin launches versatile hall effect geartooth sensor for automotive grade applications Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

New image processing development platform empowers system designers

Item No:	Item Information
1593487	New image processing development platform empowers system designers Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

EMC filters: UL/cUL approval for new two-line SIFI-H filters

Item No:	Item Information
1593488	EMC filters: UL/cUL approval for new two-line SIFI-H filters Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

Testing times: Preventing water vapour from making electronics fail

Item No:	Item Information
1593489	Testing times: Preventing water vapour from making electronics fail Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

Strategic Test announces world's smallest "Monahans P" (PXA290) embedded SOM

Item No:	Item Information
1593490	Strategic Test announces world's smallest "Monahans P" (PXA290) embedded SOM Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

The MathWorks announces major upgrades of control design software

Item No:	Item Information
1593491	The MathWorks announces major upgrades of control design software Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

Digital milliohmmeter combines versatility and accuracy

Item No:	Item Information
1593492	Digital milliohmmeter combines versatility and accuracy Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

Welwyn announces new ULR series

Item No:	Item Information
1593493	Welwyn announces new ULR series Journal: Microelectronics International Vol : 24 Issue: 1 View HTML

Internet commentary

Internet commentary

Item No:	Item Information
1593494	Internet commentary Journal: Microelectronics International Vol : 24 Issue: 1 Author(s): Brian Ellis View HTML