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Article Information:
Title:
An alternative to the Weibull step-stress model
Author(s):
Imad H. Khamis, James J. Higgins
Journal:
International Journal of Quality & Reliability Management
Year:
1999
Volume:
Issue:
Page:
158 - 165
ISSN:
0265-671X
DOI:
10.1108/02656719910249883
Publisher:
MCB UP Ltd
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Abstract:
An alternative is proposed to the Weibull cumulative exposure model in step-stress testing, that we call the transformed exponential model. The proposed model comes from a natural transformation of the exponential cumulative exposure model. It is as flexible as the cumulative exposure model for describing data, but its mathematical form makes it easier to obtain parameter estimates and standard errors. Inferential procedures and optimum designs are discussed for two-step accelerated test plans with known shape parameter.
Keywords:
Models, Product testing, Reliability, Tests
Article Type:
Research Paper