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A study of thermo‐mechanical reliability of lead‐free PTH solder joints

Jennifer Nguyen (Flextronics International, San Jose, California, USA)
David Geiger (Flextronics International, San Jose, California, USA)
Dan Rooney (Flextronics International, San Jose, California, USA)
Dongkai Shangguan (Flextronics International, San Jose, California, USA)

Soldering & Surface Mount Technology

ISSN: 0954-0911

Article publication date: 10 April 2009

432

Abstract

Purpose

The purpose of this paper is to consider PTH solder joint reliability, particularly on the PTH solder joints with partial hole‐fill and without pin protrusion. Also, the impact of voiding on the solder joint reliability is discussed.

Design/methodology/approach

Thermal cycling tests for samples of different hole‐fill percentages and voiding were conducted, and cross‐sections of the PTH solder joints were performed to evaluate the solder microstructure, intermetallic formation, via hole‐fill, and the condition of the PTH metallization and PCB dielectric prior to thermal cycling and at different times during thermal cycling.

Findings

Different failure mechanisms were observed for solder joints with and without pin protrusion. PTH components with pin protrusion had better through hole‐fill and less voids than PTH components without pin protrusion.

Originality/value

The paper discusses in detail the effect of hole‐fill percentage and voiding on PTH solder joint reliability.

Keywords

Citation

Nguyen, J., Geiger, D., Rooney, D. and Shangguan, D. (2009), "A study of thermo‐mechanical reliability of lead‐free PTH solder joints", Soldering & Surface Mount Technology, Vol. 21 No. 2, pp. 39-47. https://doi.org/10.1108/09540910910947462

Publisher

:

Emerald Group Publishing Limited

Copyright © 2009, Emerald Group Publishing Limited

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