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Extraction of circuit parameters from PCB by FDTD and SIBC

Karl Hollaus (Center for Computational Engineering Science (CCES), RWTH Aachen University, Aachen, Germany)
Oszkár Bíró (Institute for Fundamentals and Theory in Electrical Engineering, Graz University of Technology, Graz, Austria)
Gernot Matzenauer (Institute for Fundamentals and Theory in Electrical Engineering, Graz University of Technology, Graz, Austria)
Christian Stockreiter (Institute for Fundamentals and Theory in Electrical Engineering, Graz University of Technology, Graz, Austria)
Bernhard Weiß (Institute for Fundamentals and Theory in Electrical Engineering, Graz University of Technology, Graz, Austria)
Peter Caldera (Infineon Technologies, Microelectronic Design Center, Austria GmbH, Villach, Austria)
Gerhard Paoli (Infineon Technologies, Microelectronic Design Center, Austria GmbH, Villach, Austria)

Abstract

Purpose

The purpose of this paper is to study the extraction of scattering parameters (SPs) from simple structures on a printed circuit board (PCB) by the finite difference time domain (FDTD) method with the aid of a surface impedance boundary condition (SIBC).

Design/methodology/approach

The incorporation of SIBC into the FDTD method is described for the general case. The excitation of a field problem by a field pattern and the transition from the field solution to a circuit representation by SPs is discussed.

Findings

SPs obtained by FDTD with SIBC are validated with semi‐analytic solutions and compared with results obtained by different numerical methods. Results of a microstrip with a discontinuity considering losses are presented demonstrating the capability of the present method.

Originality/value

The comparison of numerical results obtained by different methods demonstrates the capability of the present method to extract SPs from PCBs very efficiently.

Keywords

Citation

Hollaus, K., Bíró, O., Matzenauer, G., Stockreiter, C., Weiß, B., Caldera, P. and Paoli, G. (2009), "Extraction of circuit parameters from PCB by FDTD and SIBC", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 28 No. 4, pp. 1091-1101. https://doi.org/10.1108/03321640910959134

Publisher

:

Emerald Group Publishing Limited

Copyright © 2009, Emerald Group Publishing Limited

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