Optimum log‐logistic step‐stress model with censoring

Abstract

Purpose

To obtain an optimal simple time‐step stress accelerated life test for the case involving pre‐specified censoring time. Such a test saves time and expenses over tests at normal conditions.

Design/methodology/approach

Most of the available literature on step‐stress accelerated life testing deals with the exponential and weibull distribution. The log‐logistic life distribution has been found appropriate for high reliability components.

Findings

The method developed has been illustrated using the data simulated from cumulative exposure log‐logistic step‐stress model with censoring time specified.

Originality/value

The model suggested is appropriate in the field of high reliability components such as insulation system.

Citation

Wanti Srivastava, P. and Shukla, R. (2008), "Optimum log‐logistic step‐stress model with censoring", International Journal of Quality & Reliability Management, Vol. 25 No. 9, pp. 968-976. https://doi.org/10.1108/02656710810908115