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A new approach to the multiple objective facility layout problem

D.Y. Sha (National Chiao Tung University, Taiwan, Republic of China)
Chien‐Wen Chen (Chaoyang University of Technology, Taiwan, Republic of China)

Integrated Manufacturing Systems

ISSN: 0957-6061

Article publication date: 1 February 2001

2597

Abstract

This paper presents a new approach for combining the quantitative and qualitative objectives to resolve the facility layout problem. In previous studies, there are various approaches to generate solutions for the facility layout problem. Suboptimal solutions need to be considered for large layout problems since optimal algorithms are computationally infeasible. Therefore, it is important to set criteria to measure the quality of various solutions. In this paper, a new measure of solution quality, the probability of superiority, is offered for the determination of the probability that one layout is better than the others. An example is presented to illustrate our proposed approach.

Keywords

Citation

Sha, D.Y. and Chen, C. (2001), "A new approach to the multiple objective facility layout problem", Integrated Manufacturing Systems, Vol. 12 No. 1, pp. 59-66. https://doi.org/10.1108/09576060110361546

Publisher

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MCB UP Ltd

Copyright © 2001, MCB UP Limited

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