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The Optimal Parameter Design of CD‐R Substrate

Jhy‐Ping Jhang (Department of Industrial Management, Huafan University, No. 1, Hua Fan Rd., Shihtin Hsiang, Taipei Hsien, Taiwan, 223, ROC)
Shi‐Hao Lin (Department of Industrial Management, Huafan University, No. 1, Hua Fan Rd., Shihtin Hsiang, Taipei Hsien, Taiwan, 223, ROC)

Asian Journal on Quality

ISSN: 1598-2688

Article publication date: 21 August 2005

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Abstract

In recent years, high‐speed recording CD‐R has already become the mainstream of CD‐R market. Therefore, to promote the efficiency of recording CD‐R is of significant importance. This study uses Taguchi’s parameter design to improve the yield rate for the process of CD‐R substrate. We have found 13 three‐level controllable factors from the fishbone diagram, repeted 10 times the experiment with the L27(313) orhogonal array, and measured seven quality characteristics. We employ four general methods to find the optimal parameter conditions individually. Then, we perform the confirmation experiement and compare the results. Finally, we obtain the optimal parameter conditions. According to the analysis of benefits, the optimal parameter conditions can reduce the quality loss of CD‐R substrte to about 21 per cent. In the future, the results can be extended to other research of DVD‐R substrate.

Keywords

Citation

Jhang, J. and Lin, S. (2005), "The Optimal Parameter Design of CD‐R Substrate", Asian Journal on Quality, Vol. 6 No. 2, pp. 105-115. https://doi.org/10.1108/15982688200500016

Publisher

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Emerald Group Publishing Limited

Copyright © 2005, Emerald Group Publishing Limited

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