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A review of parametric clothing pattern CAD software methodology

Ah Lam Lee (Kyungpook National University, Daegu, South Korea)
Hyunsook Han (Chungbuk National University, Cheongju, South Korea)

International Journal of Clothing Science and Technology

ISSN: 0955-6222

Article publication date: 5 January 2024

Issue publication date: 13 February 2024

108

Abstract

Purpose

The main issue in the mass customization of apparel products is how to efficiently produce products of various sizes. A parametric pattern-making system is one of the notable ways to rectify this issue, but there is a lack of information on the parametric design itself and its application to the apparel industry. This study compares and analyzes three types of parametric clothing pattern CAD (P-CAD) software currently in use to identify the characteristics of each, and suggest a basic guideline for efficient and adaptable P-CAD software in the apparel industry.

Design/methodology/approach

This study compared three different types of P-CAD software with different characteristics: SuperALPHA: PLUS(as known as YUKA), GRAFIS and Seamly2D. The authors analyzed the types and management methodologies of each software, according to the three essential components that refer to previous studies about parametric design systems: entities, constraints and parameters.

Findings

The results demonstrated the advantages and disadvantages of methodology in terms of three essential components of each software. Based on the results, the authors proposed five strategies for P-CAD development that can be applied to the mass customization of clothing.

Originality/value

This study is meaningful in that it consolidates and organizes information about P-CAD software that has previously been scattered. The framework used in this study has an academic value suggesting guidelines to analyze P-CAD systems.

Keywords

Acknowledgements

This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (Ministry of Science, ICT and Future Planning) (No. NRF-2017R1A2B4012071).

Citation

Lee, A.L. and Han, H. (2024), "A review of parametric clothing pattern CAD software methodology", International Journal of Clothing Science and Technology, Vol. 36 No. 1, pp. 102-116. https://doi.org/10.1108/IJCST-01-2023-0002

Publisher

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Emerald Publishing Limited

Copyright © 2023, Emerald Publishing Limited

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