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Simulation and prediction of seam puckering in the layers of woven fabrics using a yarn-level model

Motahareh Kargar (Department of Textile Engineering, Yazd University, Yazd, Iran)
Pedram Payvandy (Department of Textile Engineering, Yazd University, Yazd, Iran)

International Journal of Clothing Science and Technology

ISSN: 0955-6222

Article publication date: 21 December 2022

Issue publication date: 22 March 2023

79

Abstract

Purpose

Simulating the behavior of clothing has always been of interest in the apparel, fashion and computer game industries. With the development of these industries, there is a need to increase the accuracy of clothing simulation techniques. A garment contains many seams whose behavior affects its final appearance. In this study, a numerical model is presented to simulate seam puckers in single- and double-layer fabrics.

Design/methodology/approach

A yarn-level simulation technique has been used for this purpose. Based on this technique, the individual threads in the fabric structure and the sewing threads are modeled separately. Then, their behavior and interaction with each other are considered in the seam pucker model.

Findings

The model is used to simulate the real samples. The results show that the proposed model is able to simulate the degree of seam puckering for a single-layer fabric with an average error of 7.9% and for a double-layer fabric with an average error of 8.5%.

Originality/value

The behavior of the seam is affected by the properties, behavior and interaction of the sewing threads and yarns in the fabric structure. In previous studies, the parameters related to seams and fabrics were not fully considered. In this study, a new yarn-level model is presented to simulate seam puckering in woven fabrics. The most important advantage of this type of simulation is the ability to examine the interaction of fabric threads as well as the interaction of sewing threads with each other and with the threads of the fabric structure.

Keywords

Citation

Kargar, M. and Payvandy, P. (2023), "Simulation and prediction of seam puckering in the layers of woven fabrics using a yarn-level model", International Journal of Clothing Science and Technology, Vol. 35 No. 2, pp. 245-265. https://doi.org/10.1108/IJCST-05-2022-0063

Publisher

:

Emerald Publishing Limited

Copyright © 2022, Emerald Publishing Limited

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