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A lifecycle cost model considering both component and system burn-in for operationally unrepairable systems

Kah How Teo (Thales Solutions Asia Pte Ltd, Singapore, Singapore) (S4TIN Laboratory, Nanyang Technological University, Singapore, Singapore) (School of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore, Singapore)
Kang Tai (School of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore, Singapore)
Vincenzo Schena (Thales Alenia Space, Rome, Italy)
Luca Simonini (Thales Alenia Space, Rome, Italy)

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Article publication date: 9 September 2021

Issue publication date: 17 October 2022

121

Abstract

Purpose

This study presents a lifecycle cost model considering multi-level burn-in for operationally unrepairable systems including assembly and warranty costs. A numerical method to obtain system reliability under component replacement during burn-in is also presented with derived error bounds.

Design/methodology/approach

The final system reliability after component and system burn-in is obtained and warranty costs are computed. On failure during operation, the system is replaced with another that undergoes an identical burn-in procedure. Cost behaviours for a small and large system are shown in a numerical example.

Findings

There are more cost savings when system burn-in is conducted for a large system whereas a strategy focusing on component burn-in only can also result in cost savings for small systems. In addition, a minimum system burn-in duration is required before cost savings are achieved for these operationally unrepairable systems.

Originality/value

The operationally unrepairable system is a niche class of systems which small satellites fall under and no such study has been conducted before. The authors present a different approach towards the testing of small satellites for a constellation mission.

Keywords

Acknowledgements

This work was partly supported by the Singapore Economic Development Board ‒ Thales Solutions Asia Pte. Ltd. Joint Industrial Postgraduate Program, which the authors gratefully acknowledge.

Citation

Teo, K.H., Tai, K., Schena, V. and Simonini, L. (2022), "A lifecycle cost model considering both component and system burn-in for operationally unrepairable systems", International Journal of Quality & Reliability Management, Vol. 39 No. 9, pp. 2081-2103. https://doi.org/10.1108/IJQRM-03-2021-0073

Publisher

:

Emerald Publishing Limited

Copyright © 2021, Emerald Publishing Limited

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