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Condition monitoring of aluminium electrolytic capacitors using accelerated life testing: A comparison

Cherry Bhargava (Department of Electronics and Communication Engineering, IK Gujral Punjab Technical University, Kapurthala, India)
Vijay Kumar Banga (Department of Electronics and Communication Engineering, Amritsar College of Engineering and Technology, Amritsar, India)
Yaduvir Singh (Department of Electrical Engineering, Harcourt Butler Technological Institute, Kanpur, India)

International Journal of Quality & Reliability Management

ISSN: 0265-671X

Article publication date: 3 September 2018

210

Abstract

Purpose

An electrolytic capacitor is extensively used as filtering devices in various power supplies and audio amplifiers. Low cost and higher value of capacitance make it more well known. As environmental stress and electrical parameters increase, capacitors degrade on accelerated pace. The paper aims to discuss these issues.

Design/methodology/approach

This paper focusses on the impact of thermal stress on electrolytic capacitors using accelerated life testing technique. The failure time was calculated based on the change in capacitance, equivalent series resistance and weight loss. The experimental results are compared with the outcome of already available life monitoring methods, and the accuracy level of these methods is accessed.

Findings

The results of all the three methods are having maximum 55 per cent accuracy. To enhance the accuracy level of theoretical methods, modifications have been suggested. A new method has been proposed, whose outcome is 92 per cent accurate with respect to experimentally obtained outcomes.

Practical implications

To assess the capacitor’s reliability using an experimental and modified theoretical method, failure prediction can be done before it actually fails.

Originality/value

A new method has been proposed to access the lifetime of capacitor.

Keywords

Citation

Bhargava, C., Banga, V.K. and Singh, Y. (2018), "Condition monitoring of aluminium electrolytic capacitors using accelerated life testing: A comparison", International Journal of Quality & Reliability Management, Vol. 35 No. 8, pp. 1671-1682. https://doi.org/10.1108/IJQRM-06-2017-0115

Publisher

:

Emerald Publishing Limited

Copyright © 2018, Emerald Publishing Limited

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