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An in situ surface defect detection method based on improved you only look once algorithm for wire and arc additive manufacturing

Jun Wu (School of Software, Huazhong University of Science and Technology, Wuhan, China)
Cheng Huang (School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China)
Zili Li (School of Software, Huazhong University of Science and Technology, Wuhan, China)
Runsheng Li (School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China)
Guilan Wang (School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, China)
Haiou Zhang (School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China)

Rapid Prototyping Journal

ISSN: 1355-2546

Article publication date: 15 November 2022

Issue publication date: 2 May 2023

356

Abstract

Purpose

Wire and arc additive manufacturing (WAAM) is a widely used advanced manufacturing technology. If the surface defects occurred during welding process cannot be detected and repaired in time, it will form the internal defects. To address this problem, this study aims to develop an in situ monitoring system for the welding process with a high-dynamic range imaging (HDR) melt pool camera.

Design/methodology/approach

An improved you only look once version 3 (YOLOv3) model was proposed for online surface defects detection and classification. In this paper, improvements were mainly made in the bounding box clustering algorithm, bounding box loss function, classification loss function and network structure.

Findings

The results showed that the improved model outperforms the Faster regions with convolutional neural network features, single shot multibox detector, RetinaNet and YOLOv3 models with mAP value of 98.0% and a recognition rate of 59 frames per second. And it was indicated that the improved YOLOv3 model satisfied the requirements of real-time monitoring well in both efficiency and accuracy.

Originality/value

Experimental results show that the improved YOLOv3 model can solve the problem of poor performance of traditional defect detection models and other deep learning models. And the proposed model can meet the requirements of WAAM quality monitoring.

Keywords

Acknowledgements

This work is supported by the Ministry of Science and Technique of the People’s Republic China under the National Key R&D Program of China [Grant no. 2019YFB1311100] and Ministry of Industry and Information Technology of the People’s Republic China under Special Research Project of Chinese Civil Aircraft [Grant no. MJ-2017-G-60].

Competing interests: The authors declare no competing interests.

Citation

Wu, J., Huang, C., Li, Z., Li, R., Wang, G. and Zhang, H. (2023), "An in situ surface defect detection method based on improved you only look once algorithm for wire and arc additive manufacturing", Rapid Prototyping Journal, Vol. 29 No. 5, pp. 910-920. https://doi.org/10.1108/RPJ-06-2022-0211

Publisher

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Emerald Publishing Limited

Copyright © 2022, Emerald Publishing Limited

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