Noise sources in polymer thick-film resistors
Abstract
Purpose
The paper aims to get the knowledge about electrical properties, including noise, of modern polymer thick-film resistors (TFRs) in a wide range of temperature values, i.e. from 77 K up to room temperature. The sample resistors have been made of different combinations of resistive compositions, either ED7100 or MINICO (M2013, M2010), and conducting pastes (for contacts) Cu- or Au-based, deposited on FR-4 laminate.
Design/methodology/approach
The paper opted for an experimental study using either current noise index measurement in room temperature for large batch of samples or noise spectra measurement in temperature range 77-300 K for selected samples. Obtained noise maps, i.e. plots of power spectral density of voltage fluctuations vs frequency and temperature, have been used for evaluation of noise describing parameters like material noise intensity C and figure of merit K, for TFRs made of different combinations of resistive/conductive materials. Comparison of the parameters gives the information about the quality of the technology and matching the conductive/resistive materials.
Findings
Experiments confirmed that the main noise component is 1/f resistance noise. However, low-frequency noise spectroscopy revealed that also noise components of Lorentzian shape, associated with thermally activated noise sources exist. Their activation energies have been found to be of a few tenths of eV.
Research limitations/implications
The noise intensity of polymer TFRs depends on technology process and/or contacts materials. The use of Au contacts leads to better noise properties of the resistors. The results of the studies might be helpful for further improvement of thick-film technology, especially for manufacturing low-noise, stable and reliable TFRs.
Practical implications
The paper includes indications for the materials selection for thick-film technology to manufacture low-noise, reliable and stable TFRs.
Originality/value
Experimental studies of electrical properties of polymer TFRs by means of noise spectra measurements in wide range of temperature is rare. They give fundamental knowledge about noise sources in the modern passive electronic components as well as practical indications of selection material for thick-film technology, to obtain high performance components and get technological advantage.
Keywords
Acknowledgements
The work has been supported from Grant DEC-2011/01/B/ST7/06564 funded by the National Science Centre (Poland) and from Rzeszow University of Technology Project DS (statutory activity of Department of Electronics Fundamentals) and from statutory activity of Wroclaw University of Technology. The studies were performed with the use of equipment purchased in project No. POPW.01.03.00-18-012/09 from the Structural Funds, The Development of Eastern Poland Operational Programme, co-financed by the European Union and the European Regional Development Fund.
Citation
Stadler, A.W., Kolek, A., Mleczko, K., Zawiślak, Z., Dziedzic, A. and Stęplewski, W. (2015), "Noise sources in polymer thick-film resistors", Soldering & Surface Mount Technology, Vol. 27 No. 3, pp. 115-119. https://doi.org/10.1108/SSMT-04-2015-0014
Publisher
:Emerald Group Publishing Limited
Copyright © 2015, Emerald Group Publishing Limited