GE Sensing & Inspection Technologies show new products at Aerospace Testing

Aircraft Engineering and Aerospace Technology

ISSN: 0002-2667

Article publication date: 4 September 2009

68

Citation

(2009), "GE Sensing & Inspection Technologies show new products at Aerospace Testing", Aircraft Engineering and Aerospace Technology, Vol. 81 No. 5. https://doi.org/10.1108/aeat.2009.12781ead.001

Publisher

:

Emerald Group Publishing Limited

Copyright © 2009, Emerald Group Publishing Limited


GE Sensing & Inspection Technologies show new products at Aerospace Testing

Article Type: Equipment and software From: Aircraft Engineering and Aerospace Technology: An International Journal, Volume 81, Issue 5

GE Sensing & Inspection Technologies showed a range of products from its complementary portfolios at the recent Aerospace Testing, Design and Manufacturing Expo 2009. The company demonstrated its ability to help customers achieve productivity through inspection solutions and measure what matters most by exhibiting non-destructive testing equipment and measurement products, which are particularly relevant to the aerospace sector.

On show for the first time was the new Apollo eddy current instrument, which offers multi-channel, multi-frequency capability. Combined with its industry-proven software, Apollo can, it is claimed, significantly increase inspection speeds and improve operational efficiency in a wide range of applications. Other eddy current equipment on display included: the Phasec 3 family of portable eddy current flaw detectors which is said to be ideal for crack and corrosion detection in the most difficult of inspection environments; and the latest eddy current array technology which allows faster scanning without the need for a mechanical scanner.

Remote visual inspection equipment on the stand includes the XLG3, which offers comprehensive connectivity and intuitive control and the recently launched XLGo, which weighs just 3.8 lb and is totally self-contained, requiring no cable connection to any associated processing or drive instrument.

Completing the range of inspection instruments and systems on view was the Phasor XS, the portable phased array, which incorporates TOPView, allowing users a new inspection perspective. This is generated by using a gated region in the sector scan and enables users to record indications more easily and accurately.

Complementing GE's inspection solutions were examples of the company's ground/flight test for the global aerospace industry. There was also an opportunity to see the company's advanced modular calibrator, a hand-held test and calibration system that combines an advanced, multi-function calibrator with world class pressure measurement and generation capability. Its modular concept allows its discrete components to be used as stand-alone instruments, allowing significant flexibility both in cost of ownership and in functionality.

Details available from: GE Sensing & Inspection Technologies, Tel.: +44 1925 604095.

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