STATISTICAL ASSESSMENT OF THE FABRICATION YIELD OF MULTI‐COMPONENT LOGIC CIRCUITS

Abstract

A statistical model is used as the basis of a rapid, simple and precise method of predicting the fabrication yield of multi‐component logic circuits. The method is based on the statistical behaviour of the individual circuit components.

Citation

SPREVAK, D. and FERGUSON, R.S. (1984), "STATISTICAL ASSESSMENT OF THE FABRICATION YIELD OF MULTI‐COMPONENT LOGIC CIRCUITS", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 3 No. 4, pp. 217-224. https://doi.org/10.1108/eb009997