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Quality Issues in Chip‐on‐board (COB) Technology

E. Giani (CompAS Electronics Inc., Epitek Microelectronics Division, Kanata, Ontario, Canada)
J.P. Mathurin (CompAS Electronics Inc., Epitek Microelectronics Division, Kanata, Ontario, Canada)

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 February 1994

48

Abstract

Critical processing steps of COB manufacturing, as implemented at Epitek, are reported. They include testing of incoming boards, cleaning, bonding parameters, bonding defects and statistical process control.

Citation

Giani, E. and Mathurin, J.P. (1994), "Quality Issues in Chip‐on‐board (COB) Technology", Microelectronics International, Vol. 11 No. 2, pp. 5-10. https://doi.org/10.1108/eb044525

Publisher

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MCB UP Ltd

Copyright © 1994, MCB UP Limited

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