Keywords
Citation
(1999), "Schlumberger introduces ETC 1000 for breakthrough precision in test site thermal control", Microelectronics International, Vol. 16 No. 2. https://doi.org/10.1108/mi.1999.21816bad.010
Publisher
:Emerald Group Publishing Limited
Copyright © 1999, MCB UP Limited
Schlumberger introduces ETC 1000 for breakthrough precision in test site thermal control
Schlumberger introduces ETC 1000 for breakthrough precision in test site thermal control
Keywords Schlumberger, Semiconductors, Thermal testing
Schlumberger introduces today the ETC 1000, a thermal control system providing breakthrough precision in semiconductor device thermal control. The ETC 1000 delivers unparalleled performance for die and transistor junction temperature control, especially for high power devices, such as microprocessors and system-on-a-chip ASICs.
The Schlumberger ETC 1000 is based on an innovative new technology that outpaces present devices under test roadmap power densities. Compatible with any automatic test equipment or system test application, the ETC 1000 delivers temperature control accuracy and response times that eclipse current thermal control system technologies. The innovative new system provides near-instantaneous set point temperature switching, in addition to high precision thermal control, leading to improved product engineering efficiency and shortened time to market.
For futher information, please contact Schlumberger Test & Transactions. Tel: +33 (0)147 46 79 50; Fax: +33 (0)147 46 68 66.