Citation
(2010), "Camtek selected as advanced STEM/TEM sample preparation solution", Microelectronics International, Vol. 27 No. 3. https://doi.org/10.1108/mi.2010.21827cab.002
Publisher
:Emerald Group Publishing Limited
Copyright © 2010, Emerald Group Publishing Limited
Camtek selected as advanced STEM/TEM sample preparation solution
Article Type: Industry news From: Microelectronics International, Volume 27, Issue 3
A leading Semiconductor Equipment Supplier has selected the Xact, Camtek’s Advanced scanning transmission electron microscope (STEM/TEM) sample preparation solution, enabling material analysis and verification. The Xact system will be installed in the second quarter of 2010.
Shrinking feature dimensions and advances in material complexity require a scale of analysis only supplied by STEM and TEM. Sample preparation for front end of the line process monitoring and offline failure analysis has become a bottleneck. Existing sample preparation solutions are falling short of meeting the evolving requirements of high resolution and high contrast imaging and analysis. Camtek’s Xact overcomes these limitations by applying the ground-breaking adaptive ion milling (AIM™) technology, and offers negligible artifacts and improved throughput for customers. The Xact was developed by SELA – Semiconductor Engineering Laboratories Ltd (“SELA”), who was acquired by Camtek in November 2009.
Camtek Ltd provides automated solutions dedicated for enhancing production processes and yield, enabling our customers new technologies in two industries; semiconductors, printed circuit board (PCB) & IC Substrates.
For more information visit: www.camtek.co.il