Keywords
Citation
(2001), "Control software for Hitachi S-3X00 Series SEMs", Pigment & Resin Technology, Vol. 30 No. 5. https://doi.org/10.1108/prt.2001.12930eab.004
Publisher
:Emerald Group Publishing Limited
Copyright © 2001, MCB UP Limited
Control software for Hitachi S-3X00 Series SEMs
Control software for Hitachi S-3X00 Series SEMs
Keywords: Hitachi Scientific Instruments, Software, Control systems
A new Windows™-based graphical user interface (GUI) has been announced for Hitachi Scientific Instruments' S-3000H and S-3500H conventional SEMs and S-300ON and S-350ON variable pressure SEMS. This new control system claims improved display, set-up, report generation and maintenance facilities.
System operation and image display have been improved with the introduction of adjustable size buttons on the tool bar and a choice of display formats for the SEM image up to full monitor size. For added versatility, a scrollable display of thumbnails of up to 16 captured images can be displayed alongside the main image window.
To aid easy operation further, images can be captured together with a comprehensive range of instrument operating conditions, which can subsequently be readily recalled. Operational parameters stored include magnification, accelerating voltage, gun bias voltage and, for VPSEM versions, vacuum mode and conditions. If the instrument is equipped with a five-axis motorised stage, then recalling the stored parameters automatically sets the appropriate working distance. In addition, if a suitable vacuum is present, the beam is automatically switched on and automatic focus, brightness and contrast initiated to produce a focused image.
Initial set-up for a specimen is said to be greatly facilitated by an on-screen auto-navigation display. This allows the user to identify the different preparation steps required for a variety of sample types and guides the user to the most appropriate SEM operating conditions for these different samples.
Production of well-presented reports is an essential part of scanning electron microscopy. The new GUI is said to offer a drag and drop facility to allow images to be positioned and resized on the report page. Not only are the instrument operating conditions for each image automatically displayed, but the micron marker and displayed magnification are said to be automatically adjusted as the image is resized.
A computer-aided animation has been included in the GUI to guide the user through routine maintenance routines. On-screen displays not only show the particular instruments parts that may require routine maintenance and how to carry it out, but also explain the symptoms that would result should maintenance be required.
Further details are available from Hitachi Scientific Instruments. Tel: +44 (0)118 932 8623; Fax: +44 (0)118 932 8779; E-mail: hsi@nissei-eu.com; Web site: www. hsi-europe.com