Citation
(2002), "IPC-9261, in process DPMO and estimated yield for PWA's", Soldering & Surface Mount Technology, Vol. 14 No. 3. https://doi.org/10.1108/ssmt.2002.21914cad.015
Publisher
:Emerald Group Publishing Limited
Copyright © 2002, MCB UP Limited
IPC-9261, in process DPMO and estimated yield for PWA's
IPC-9261, in process DPMO and estimated yield for PWA's
Dynamix Technology Ltd introduces IPC-9261. This document defines consistent methodologies for computation of in-process defects per million opportunities (DPMO) metrics for any evaluation stage in the assembly process. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO addressed in IPC-7912.
A guide to defect catergorisation is provided that can serve as a base for summarising and reporting in-process defects when used with J-STD-001C and IPC-A-610C. It can also be used to develop process step estimated yield – the expected percentage of assemblies with no defects for a particular process step or combined process steps, based on historical defect rates 14 Pages.
Preview IPC-9261 at http://www. dynamix technology.com/news.htm