ISSN: 0260-2288
Online from: 1981
Subject Area: Electrical & Electronic Engineering
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| Title: | Metrology and 3D trends: a snapshot in 2009 |
|---|---|
| Author(s): | Adil Shafi, (ADVENOVATION, Inc., Houghton, Michigan, USA) |
| Citation: | Adil Shafi, (2010) "Metrology and 3D trends: a snapshot in 2009", Sensor Review, Vol. 30 Iss: 2, pp.111 - 115 |
| Keywords: | Dimensional measurement, Image sensors, Inspection, Measurement, Robotics |
| Article type: | Technical paper |
| DOI: | 10.1108/02602281011022698 (Permanent URL) |
| Publisher: | Emerald Group Publishing Limited |
| Abstract: | Purpose – Technological advances in recent years have led to the development and implementation of a variety of techniques and platforms in three-dimensional (3D) metrology. These techniques include improvements in sensory capabilities, computational speed, flexibility in reporting, and ease of use. The purpose of this paper is to address several developments in this regard. Design/methodology/approach – Metrology, or the science of measurement, continues to enjoy relevance and importance in the quality and handling of manufactured goods. In most instances, measurement requires a 3D quantification of an object's dimensions. These data are used for product quality or for robotic guidance applications. Findings – As technology progresses, a snapshot of trends is presented in 2009. Notable amongst these trends are advances in sensory capabilities, computational speed, flexibility in reporting, and ease of use. These continuous improvements are helping to increase adoption curves in an ever-competitive quality and cost driven, and increasingly international, manufacturing market. According to Paul Kellett, Director of Market Analysis at the Robotics Industries Association (www.robotics.org), there have been, in the past, typically three impediments to adoption: ease of use, cost, and performance of technology. Originality/value – In conclusion, metrology and 3D trends are evolving continuously to equip manufacturers with enhanced tools for measurement, quality control, robot guidance and absolute accuracy. Much work lies ahead in the area of software for applications and specifically for vertical applications. |
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