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Journal cover: Microelectronics International

Microelectronics International

ISSN: 1356-5362

Online from: 1982

Subject Area: Electrical & Electronic Engineering

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Table of contents:
Volume 26 issue 1

Published: 2009, Start page: p3

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Articles
Article Id: Article Information:
1769120 Analysis of non-ideal effects in coupled VLSI interconnects with active and passive load variations
Gargi Khanna, Rajeevan Chandel, Ashwani Kumar Chandel, Sankar Sarkar (pp. 3 - 9)
Keywords: Circuit properties, Electrical components, Electrical load, Integrated circuits
Article type: Research paper
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1769121 Wire bonding using copper wire
Z.W. Zhong (pp. 10 - 16)
Keywords: Copper, Joining processes, Wires
Article type: General review
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1769122 A simple rail-to-rail CMOS voltage follower
Varakorn Kasemsuwan, Weerachai Nakhlo (pp. 17 - 21)
Keywords: Integrated circuits, Simulation
Article type: Research paper
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1769123 FPGA placement by using Hopfield neural network
Andrzej Kos, Zbigniew Nagórny (pp. 22 - 32)
Keywords: Circuit properties, Neural nets, Programming and algorithm theory
Article type: Research paper
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1769124 VDMOSFET reliability dependence on the integrated drain-source junction
R. El Bitar, R. Habchi, C. Salame, A. Khoury, P. Mialhe, B. Nsouli (pp. 33 - 36)
Keywords: Integrated circuits, Product reliability
Article type: Research paper
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1769125 A proposed SRAM cell for low power consumption during write operation
C.M.R. Prabhu, Ajay Kumar Singh (pp. 37 - 42)
Keywords: Integrated circuits, Power transistors
Article type: Research paper
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1769126 Microwave dielectric and attenuation properties of Ni0.7-xCoxZn0.3Fe2O4 thick films
M.K. Rendale, S.D. Kulkarni, Vijaya Puri (pp. 43 - 46)
Keywords: Microwaves, Oxides, Thick-film circuits
Article type: Research paper
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1769127 Low voltage four-quadrant analog multiplier using dynamic threshold MOS transistors
Vandana Niranjan, Maneesha Gupta (pp. 47 - 52)
Keywords: Integrated circuits, Signal processing, Voltage
Article type: Research paper
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1769128 Analytical modeling for the estimation of leakage current and subthreshold swing factor of nanoscale double gate FinFET device
Balwinder Raj, A.K. Saxena, S. Dasgupta (pp. 53 - 63)
Keywords: Electric current, Integrated circuits, Temperature measurement
Article type: Research paper
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New products

Article Id: Article Information:
1769135 Fairchild Semiconductor’s next generation DrMOS delivers over 92 percent peak efficiency in the industry’s smallest package
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1769136 Alpha Micro and Taoglas introduce smallest GPS antenna in the world
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1769137 Aries Electronics’ launch new CSP/MicroBGA test and burn-in socket
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1769138 Ultra small PLL clock generator with built-in divider/multiplier circuits
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1769139 New dual voltage supervisor module IN SOT-25
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1769140 Microchip technology debuts USB/AC load-sharing Li-Ion/Li-Polymer battery charger
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1769141 Rutronik introduce the new UTS RJ45 connector
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1769142 Optimise your solar cell manufacturing process
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1769143 Applied Nanotech (APNT) showcases a unique heat sink material known as CarbAl(™) composite
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1769144 Fanless embedded MicroPC with dual LAN
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1769145 New LFR complements CWT from PEM
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1769146 Crystal clear liquid silicone from Momentive Performance Materials enables top reproduction accuracy for camera-based driver assistance systems
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1769147 Highly transparent liquid silicone with the lowest hardness
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1769148 Aries Electronics’ new CSP/MicroBGA test and burn-in socket now accommodates devices up to 6.5 mm2
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1769149 Fairchild Semiconductor’s digital power controllers deliver highly efficient and flexible POL power conversion solutions
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1769150 Ruggedised and apparel RFID become popular
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International diary

1769134 2009 4th European Advanced Technology Workshop on Micropackaging & Thermal Management
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Industry news

1769129 2011: the year of OLED lighting?
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1769130 Prism and CME deliver interactive dining experience Inamo
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1769131 Rutronik wins JAE Distributor of Year award
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1769132 Solar technology and the “war for talent”
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Appointments

1769133 Advanced Digital Institute – ADI continues to build its team
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