Copula-based reliability analysis of gamma degradation process and Weibull failure time

The purpose of this paper is the reliability analysis for systems with dependent gamma degradation process and Weibull failure time.

Consider a life testing experiment in which a sample of n devices starts to operate at t=0 and the data are available on failure time and failure-evolving process on each individual, called in some contents wear or degradation. Ignoring the between performance characteristics dependency structure may lead us to different reliability estimations, while the dependency justly exists. In previous research, dependency between the degradation process and hard failure time has been studied in limited detail (special closed form expression). Thereafter, the dependency between two degradation processes with the same structure (gamma process) in a system is considered using the copula function.

The results indicate that ignoring the dependency structure may lead us to different reliability estimations while the dependency justly exists.

This study gives some contributions that evaluate reliability metrics with more than one failure mechanism that may not be independent and possibly follow a different distribution function. The authors have used the copula function as a basis to develop a proposal model and analysis methods. In addition, the authors discussed the identifiability of the copula. Finally, simulation data were used to review the suggested approach.