Advanced sensor technologies replace CMM touch probes

Abstract

Description of current 4DI three dimensional imaging system, a proprietary 3D vision sensing technology available from Intelligent Automation (IA), and introduction to the recently developed, next generation, HiPART (High‐resolution Phase Angle Resolved Triangulation) gauge sensor developed by a consortium in which IA participated. Both are non‐contact electro‐optical systems capable of being applied to a wide realm of inspection possibilities for the metrology industry. The HiPART sensor is one of the key non‐contact measurement technologies developed by potential end‐users of the technology, high‐technology advancement companies, and the US government in a collaborative effort to improve the measurement and inspection processes of manufactured parts. Specifications and benefits of the sensors, and examples of possible uses are outlined, illustrating the advantage that the 4DI and HiPART sensor have over standard coordinate measuring machines (CMMs). These sensors are actively being commercialized by IA, a custom automation and machine vision development company, which is introducing it to the appropriate markets.

Citation

Cremer, S.C. (2001), "Advanced sensor technologies replace CMM touch probes", Sensor Review, Vol. 21 No. 1, pp. 23-27. https://doi.org/10.1108/02602280110380557