Development of a metrological management model using the AHP and SEM techniques

Abstract

Purpose

The evaluation of management systems is usually based on a series of assumptions which are never questioned. The purpose of this paper is to focus on two of these assumptions, in order to further develop a quantitative model to evaluate metrological management in companies, based on the ISO 10012:2003 standard.

Design/methodology/approach

First, the paper uses structural equations to identify the underlying relations between the different variables of the model and conclude that it follows the typical continuous improvement cycle formulated by Deming. And second, the paper processes the opinion of experts using analytic hierarchy process (AHP) techniques in order to prove that not all the variables included in the model are equally relevant in metrological management.

Findings

The first SME analysis validates the model itself and its integration with the other management schemes in the company, all based on the Deming cycle. The second AHP analysis leads to a reformulation of the model, assigning weights to the different variables and providing better guidelines for companies to improve their metrological management.

Originality/value

This constitutes a development of the management guidelines contained in the ISO 10012:2003 standard for metrological management, establishing the appropriate evaluation procedures.

Citation

Beltrán, J., Muñuzuri, J., Rivas, M. and Martín, E. (2014), "Development of a metrological management model using the AHP and SEM techniques", International Journal of Quality & Reliability Management, Vol. 31 No. 7, pp. 841-857. https://doi.org/10.1108/IJQRM-05-2010-0068