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On variation of charge carrier mobility under influence of mismatch-induced stress in a heterostructure

Evgeny L. Pankratov (Mathematical Department of Radiophysical Faculty, Nizhny Novgorod State University, Nizhny Novgorod, Russia)
Elena A. Bulaeva (Mathematical Department of Radiophysical Faculty, Nizhny Novgorod State University, Nizhny Novgorod, Russia)

Multidiscipline Modeling in Materials and Structures

ISSN: 1573-6105

Article publication date: 15 December 2017

Issue publication date: 21 February 2018

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Abstract

Purpose

The purpose of this paper is to analyze the manufacturing of diffusion-junction heterorectifier with account relaxation of mismatch-induced stress. On the basis of the analysis, the authors formulate recommendations to increase sharpness of the p-n-heterojunction, homogeneity of concentration of dopant in the junction and charge carrier mobility.

Design/methodology/approach

The authors formulate recommendations to increase sharpness of p-n-heterojunction, homogeneity of concentration of dopant in the junction and charge carrier mobility. To formulate the recommendations, the authors analyzed the manufacturing of the junction. The authors introduce an analytical approach to analyze the manufacturing.

Findings

The authors find a possibility to increase sharpness of p-n-heterojunction, homogeneity of concentration of dopant in the junction and charge carrier mobility.

Originality/value

The results are original.

Keywords

Citation

Pankratov, E.L. and Bulaeva, E.A. (2018), "On variation of charge carrier mobility under influence of mismatch-induced stress in a heterostructure", Multidiscipline Modeling in Materials and Structures, Vol. 14 No. 1, pp. 77-90. https://doi.org/10.1108/MMMS-04-2017-0016

Publisher

:

Emerald Publishing Limited

Copyright © 2018, Emerald Publishing Limited

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