Detecting Defects in Textile Products Based on Band-pass Filtering Techniques

Abstract

Two dimensional band-pass filters can be used to enhance the edges of the defects contained in fabric images. In this paper, we designed two types of 2D band-pass filters for the automatic detection of defects. One is the matched Gabor filter, and the other is the matched Mexican hat wavelet. Experiments show that the matched Gabor filter is more suitable for defects of higher frequency, while the matched Mexican hat wavelet is more effective for defects of lower frequency. Based on the two types of band-pass filters, an automatic fabric defect detection system was designed which boasts good accuracy and high speed.

Citation

Choi, K.-f., Gong, Y. and Yeung, K.-w. (2004), "Detecting Defects in Textile Products Based on Band-pass Filtering Techniques", Research Journal of Textile and Apparel, Vol. 8 No. 2, pp. 21-27. https://doi.org/10.1108/RJTA-08-02-2004-B003