Citation
(2007), "GE CR imaging plate system BAM certified", Aircraft Engineering and Aerospace Technology, Vol. 79 No. 2. https://doi.org/10.1108/aeat.2007.12779bad.009
Publisher
:Emerald Group Publishing Limited
Copyright © 2007, Emerald Group Publishing Limited
GE CR imaging plate system BAM certified
GE CR imaging plate system BAM certified
The CRx Tower computed radiography (CR) imaging system from GE Inspection Technologies using IPS phosphor imaging plates, has been independently certified to meet the highest system class European and US standards for industrial CR. The certification was carried out by BAM, the German Federal Institute for Materials Research and Testing, who approved the system to Class IP 1/100 within EN 14784-1 and IP Special/100 within ASTM E2446 for a minimum exposure of 3.2mGy. This corresponds to a CEN and ISO film speed of 320 and maximum basic spatial resolution is 100mm at 50mm pixel scanning.
The new certification means that inspections can now be carried out with even greater confidence to take advantage of the benefits of CR over conventional film in terms of faster exposures, wider latitude, fewer retakes and significant reductions in materials and labor costs.
According to GE Inspection Technologies the CRx Tower has already been field-proven to offer fast scanning speeds and high throughput and can achieve scan resolutions of up to 50m or 20pixels/mm.
It can use a range of imaging plates from IP Standard, resulting in a D7 film IOJ (image quality indication) detection to IP Extra and IPS, both of which offer D4 film IQI detection.
As such, the CRx Tower system finds application throughout many sectors including aerospace, performing NDT tasks from corrosion monitoring to castings inspection and weld examination.
Details available from: GE Inspection Technologies, Tel: +32 3 456 2854, e-mail: jimmy.opdekapmp@ae.ge.com, web site: www.ge.com/inspectiontechnologies