Keywords
Citation
(2002), "Statistical process control from Lloyd Doyle", Circuit World, Vol. 28 No. 1. https://doi.org/10.1108/cw.2002.21728aad.002
Publisher
:Emerald Group Publishing Limited
Copyright © 2002, MCB UP Limited
Statistical process control from Lloyd Doyle
Statistical process control from Lloyd Doyle
Keywords: Statistical process control, Lloyd Doyle
A brand-new statistical process control package is now available for the Excalibur and phasor systems.
This package is able to generate log files containing relevant information from an individual or a batch of panels undergoing optical test.
AOT finds the defects and the SPC function gives the information from which process change or fixes can be actioned. SPC also gives details on both operator efficiency and productivity figures. The log information includes all defect types found on the inspection as well as parameters used such as line and spacing tolerances and exposure settings.
The log file is output in LD format, which can now be imported into and used through Microsoft Excel. This software development enables a spreadsheet output and graphical display of defect positions.
For further information, please visit http://www.lloyd-doyle.com