Soldering & Surface Mount Technology: Volume 11 Issue 1

Subject:

Table of contents

Evaluation of pre‐deposited (no‐flow) underfill for flip chip and CSP assembly

M.G. Firmstone, P.M. Bartholomew, D.J.J. Lowrie, S.H. Mannan, D.A. Hutt

The benefits of a “no flow” process have been well documented in the recent past. The limitations of the previously reported materials in current use have been overcome via a…

241

Optimizing the reflow profile via defect mechanism analysis

Ning‐Cheng Lee

A reflow profile is proposed which is engineered to optimize soldering performance based on defect mechanism analysis. In general, a slow ramp‐up rate is desired in order to…

1188

Qualification of flip chip fluxes by wetting balance and surface insulation resistance tests

Aulis Tuominen, Eero Ristolainen, Ville Lehtinen

Owing to the incessant demand for reductions in the size of portable electronics, new dense packaging technologies are required. Reflow soldering is still mainly used for…

An evaluation of the effect of ageing on the cleanability of solder flux residues

L. Zou, M. Duˇsek, C.P. Hunt, B.D. Dunn

The efficiency of cleaning of flux residues after various periods of ageing was assessed by measuring the ionic contamination removed in an Ionograph 500 SMD. The flux residues…

The impact of temperature and humidity conditions on surface insulation resistance values for various fluxes

Christopher Hunt, Ling Zou

The surface insulation resistance (SIR) test has traditionally been performed by taking measurements at certain points during a seven‐day test under well established environmental…

Solder joint reliability of plastic ball grid array packages

Chong Hua Zhong, Sung Yi

Presents the results of a study of the effects of solder ball pad metallurgy, intermetallic compound (IMC) thickness and thermal cycling on the shear strengths of PBGA package…

35
Cover of Soldering & Surface Mount Technology

ISSN:

0954-0911

Online date, start – end:

1989

Copyright Holder:

Emerald Publishing Limited

Open Access:

hybrid

Editors:

  • Professor Peng He
  • Associate Professor Shuye Zhang